Windows and Linux-Based IC Design Tools from Tanner EDA

A Complete Analog/Mixed-signal Tool Flow



Affordable, integrated analog/mixed-signal design flow that is easy to customize to your environment. The Tanner AMS IC design flow is a complete end-to-end design flow for analog/mixed-signal (AMS) IC designs. The flow consists of highly integrated front and back-end tools, from schematic capture, mixed-signal simulation and waveform probing to physical layout and foundry-compatible physical verification. All the tools in the flow share a common architecture and user interface.

Considered together these tools comprise a suite that is interoperable with many popular industry tools and industry-standard netlists. The suite minimizes risk by providing foundry support, including many foundry-certified PDKs. The tools are intuitive, easy to use and accessible from anywhere because they are platform-independent, with versions available for both Windows and Linux


Tanner S-Edit

  • Industry-standard support including tight SPICE simulation integration and waveform cross-probing
  • Directly view operating point simulation results in the schematic
  • Cross-probe between schematic, layout and LVS report with net/device highlighting
  • Configurable schematic Electrical Rule Checks (ERC)
  • Advanced array and bus support
  • Integrated with Tanner L-Edit IC to speed the layout and ECO process

Tanner T-Spice

  • Fast, accurate analog/mixed-signal circuit simulation with support for multi-threading
  • Accurately characterize circuit behavior with virtual data measurements, parameter sweeping, Monte Carlo, DC/AC, and transient analysis
  • Supports Levenberg-Marquardt non-linear optimizer, plot statements and parameter definitions, plus bit or bus logic waveform inputs
  • Lowest total cost of ownership in the industry
  • Available for Windows or Linux

Tanner Waveform Viewer

  • Dynamically linked to Tanner T-Spice simulation and Tanner S-Edit schematic capture
  • Waveform cross-probing directly in the schematic editor
  • Easily handles large (10GB+) data files
  • Create new traces based on mathematical expressions of other traces for advanced analysis and easy comparison with measured data max, min, average, intersect, rms, over/undershoot, amplitude, error, crossing, delay, period, frequency, rise/falltime, jitter, pulse width, settling time, integral, derivative, duty cycle, and slew rate

RF Domain

Tanner Eldo RF

  • Full-chip RF IC verification for wireless applications
  • Seamless integration into Mentor Graphics and other leading IC design flows
  • Closed-loop phase noise analysis for PLLs and frequency synthesizers
  • Multi-tone steady-state analysis for large RF IC designs containing thousands of elements
  • Modulated steady-state analysis with RF/baseband partitioning
  • Library of digitally modulated sources for all wireless standards
  • Strongly non-linear signal analysis
  • Built-in optimization capability

Tanner Designer

  • Easy to set up and to customize
  • Manage all simulations within a project
  • Present measurement results


Tanner L-Edit IC

  • Real-time net flylines
  • Nets & pins tracking
  • Geometry marking/highlighting/by net
  • ECO tracking

Tanner EDA Place and Route

  • Timing Driven Place and Route
  • Supports Low-Power Design Methodologies
  • Floorplan and Power plan Functionality


Tanner Calibre One

  • Tanner-Calibre One is a key part of Tanner’s complete, full-flow analog/mixed-signal (AMS) IC design suite
  • The Tanner schematic capture tool S-Edit and the physical layout editor L-Edit is tightly integrated with the Calibre verification suite
  • The Calibre platform is the industry-leader for physical verification and is qualified for sign-off by every major IC foundry and the Tanner Calibre One verification suite uses the same Calibre design kits
  • Tanner Calibre One DRC/LVS/xRC license can only be used with Tanner L-Edit